Equipment (Euro/hour) | Internal Users and Collaborators | Service for non-profit organisations * | Service for Industry* |
---|---|---|---|
Titan 80-300 E-TEM | 120 | 200 | 300 |
Nova NanoSEM | 40 | 80 | 120 |
Helios G4 Dual Beam | 80 | 140 | 200 |
NovaNanoLAB | 80 | 140 | 200 |
CM200 | 80 | 140 | 200 |
CM120 | 80 | 140 | 200 |
CM30 | 80 | 140 | 200 |
CM12 | 80 | 140 | 200 |
*All prices are net prices and subject to value added tax at the prevailing rate.
For internal users the final rates depend on total use of facilities.
For example, the actual rates were about 1/2 of DFG rates in 2014.
For example, the actual rates were about 1/2 of DFG rates in 2014.
Starting July 1st 2015, we implement a formal process for using the following CLUE microscopes: ETEM, FIB, in-situ SEM, C30, CM12, and CM120. To access the CLUE facilities a short Project Proposal (CLUE_Proposal_Formular_2018) must be filled out and submitted as MS WORD file. A CLUE Project Proposal includes information about the project, the microscope needs, estimate of costs, funding source and approval from the group leader who has the funds. This would allow us to plan resources and microscope time more proactively. New proposals may be submitted at any time to Prof. Dr. Cynthia A. Volkert (contact Volkert). They will be reviewed and discussed with you to make sure that they are feasible and make optimal use of the microscopes. After the evaluation and approval of the project you will get a project code and can start to use an equipment. The obtained results may be used in any publications provided that the CLUE is explicitly acknowledged. A suitable reference is: The use of equipment in the “Collaborative Laboratory and User Facility for Electron Microscopy” (CLUE) www.clue.physik.uni-goettingen.de is gratefully acknowledged. |
The following services are provided:
Transmission Electron Microscopy (TEM)
|
EELS elemental mapping including atomic mapping
|
Specimen Holders
|
Scanning Electron Microscopy
|
Focused Ion Beam microscopy
|
Sample preparation for SEM and TEM
|