Z02 High-resolution characterization of interfaces (Roddatis)

The goal of this project is to adjust and to further develop well established transmission electron microscopy (TEM) methods and TEM specimen preparation techniques for model systems from other CRC projects. The materials of choice display unique properties due to their ability to adopt crystal structures as a response to external stimuli, thus their initial structure has to be well characterized in order to compare with intermediate and final states. In general, TEM provides a lot of opportunities to investigate the structure and chemical composition of materials down to atomic scale but the validity of these methods and the tactics of experiment has to checked and tuned accordingly.